In Situ TKD Stage for Heating and/or Biasing

DENSsolutions now introduces an in situ TKD stage (holder) for scanning electron microscopes (SEM) and dual beam microscopes (SEM-FIB). For the first time in the market, this stage allows you to perform microstructural characterization using Transmission Kikuchi Diffraction (TKD) while heating or biasing your sample.